Team 01

Team Members

Faculty Advisor

Ahmad Bari
Nicholas Pappas
Maxime Pindrys

Ali Gokirmak


UConn Electrical & Computer Engineering Department

sponsored by
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Optical thin film characterization system

The objective of this project is to design and build an automated optical characterization setup that integrates broad spectrum light sources with an optical spectrum analyzer to calculate the film thickness, absorption coefficient and optical bandgap of thin films. The designed system is to be entirely automated and contain a temperature control mount that allows for measurements at various angles and temperatures. This device should be able to handle glass sides up to 2cm x 5cm and wafers up to 125mm in diameter.